Abstract
In this paper, we present some results relative to irradiations of natural and synthetic graphite with ∼1 GeV lead and uranium ions. High resolution transmission electron microscopy reveals no tracks in the bulk in either kinematic or diffraction contrast. Small surface patches are formed however random in distribution and proportional in number, but not equivalent to the total ion fluence. This suggests that some matter could be ejected from the entry and exit surfaces by electronic processes and are then redeposited on the surfaces.
| Original language | English |
|---|---|
| Pages (from-to) | 532-538 |
| Number of pages | 7 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
| Volume | 145 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 1 Dec 1998 |