High resolution transmission electron microscopy of GeV heavy ion irradiated graphite

A. Dunlop, G. Jaskierowicz, L. T. Chadderton*

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    9 Citations (Scopus)

    Abstract

    In this paper, we present some results relative to irradiations of natural and synthetic graphite with ∼1 GeV lead and uranium ions. High resolution transmission electron microscopy reveals no tracks in the bulk in either kinematic or diffraction contrast. Small surface patches are formed however random in distribution and proportional in number, but not equivalent to the total ion fluence. This suggests that some matter could be ejected from the entry and exit surfaces by electronic processes and are then redeposited on the surfaces.

    Original languageEnglish
    Pages (from-to)532-538
    Number of pages7
    JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
    Volume145
    Issue number4
    DOIs
    Publication statusPublished - 1 Dec 1998

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