Higher order mode conversion via focused ion beam milled Bragg gratings in silicon-on-insulator waveguides

V. G. Ta'eed*, D. J. Moss, B. J. Eggleton, D. Freeman, S. Madden, M. Samoc, B. Luther-Davies, S. Janz, D. X. Xu

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    14 Citations (Scopus)

    Abstract

    We report the first Bragg gratings fabricated by Focused Ion Beam milling in optical waveguides. We observe striking features in the optical transmission spectra of surface relief gratings in silicon-on-insulator waveguides and achieve good agreement with theoretical results obtained using a novel adaptation of the beam propagation method and coupled mode theory. We demonstrate that leaky Higher Order Modes (HOM), often present in large numbers (although normally not observed) even in nominally single mode rib waveguides, can dramatically affect the Bragg grating optical transmission spectra. We investigate the dependence of the grating spectrum on grating dimensions and etch depth, and show that our results have significant implications for designing narrow spectral width gratings in high index waveguides, either for minimizing HOM effects for conventional WDM filters, or potentially for designing devices to capitalize on very efficient HOM conversion.

    Original languageEnglish
    Pages (from-to)5274-5284
    Number of pages11
    JournalOptics Express
    Volume12
    Issue number21
    DOIs
    Publication statusPublished - Oct 2004

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