Highly sensitive AMS measurements of 53Mn

M. Poutivtsev, I. Dillmann, T. Faestermann, K. Knie, G. Korschinek*, J. Lachner, A. Meier, G. Rugel, A. Wallner

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

26 Citations (Scopus)

Abstract

Our AMS system, with the gas-filled detector system GAMS, has been optimized for measurements with 53Mn. A high sensitivity has been achieved. A newly installed cesium sputter ion source yields an improved emittance, and thus a higher mass resolution. By the extraction of the manganese molecule MnF- instead of MnO- we can suppress the isobaric chromium background in the ion source by more than a factor of three. The GAMS system achieves an isobaric suppression factor of about 3 × 108. Measurements on blank samples yielded upper limits for the 53Mn/55Mn ratios of 7 × 10-15.

Original languageEnglish
Pages (from-to)756-758
Number of pages3
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume268
Issue number7-8
DOIs
Publication statusPublished - Apr 2010
Externally publishedYes

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