HOLE COLLECTING CONTACTS BY Pt WITH PtSi FORMATION (poster)

Dirk Koenig*, Gunter Ebest

*Corresponding author for this work

Research output: Contribution to conferencePoster

Abstract

By applying an external negative drift field source for the creation of a p-conduction layer doping can be spared apart from the hole collection contact where p+ doping has to be done. If a metallic layer of sufficiently high electron work function is used a p + contact can be formed as well. Platinum (Pt) is a perfect candidate for such a contact. Unfortunately its performance is limited by the current crowding effect occuring at the edges as the space charge of a Schottky contact is rather small. However, with an area of high electron work function and conductivity underneath the Pt contact the diffusion current flows perpendicular into that region. Platinum Silicide (PtxSi) is a material which fulfills these requirements. It is synthesized by depositing Pt onto a Silicon (Si) substrate and subsequent anneal. In this paper we present experimental results and discuss advantages and drawbacks of such a contact design.
Keywords: Contact - 1: Sputtering - 2: Interfaces -- 3
Original languageEnglish
Pages1503-1506
Number of pages4
Publication statusPublished - 6 Oct 2001
Externally publishedYes
EventEuropean Photovoltaic Solar Energy Conference 2001 - Munich, Germany
Duration: 22 Oct 200126 Oct 2001

Conference

ConferenceEuropean Photovoltaic Solar Energy Conference 2001
Country/TerritoryGermany
CityMunich
Period22/10/0126/10/01

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