Hydrogen passivation of Interstitial Iron in Silicon by Annealing with PECVD Silicon Nitride Films

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    Abstract

    This paper reports on the effective passivation of interstitial iron in p-type boron-doped silicon via annealing with plasma-enhanced chemical vapour deposited (PECVD) silicon nitride films. The concentration of interstitial iron was shown to reduce by more than 90% after a 30-minute anneal at 600 900oC with the silicon nitride films present. The most effective hydrogenation of iron was found to take place at 700oC, where more than 99% of iron was passivated after 30 minutes. Results show that the observed reductions in the interstitial iron concentrations are not likely to be caused by the precipitation of iron at structural defects by a hydrogen-enhanced diffusivity of iron, as has previously been suggested.
    Original languageEnglish
    Title of host publicationProceedings of the European Photovoltaic Solar Energy Conference and Exhibition
    Place of PublicationGermany
    PublisherFraunhofer ISE
    Pages623-625
    EditionPeer Reviewed
    ISBN (Print)3936338396
    DOIs
    Publication statusPublished - 2015
    Event31st European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2015 - Hamburg, Germany
    Duration: 14 Sept 201518 Sept 2015
    http://publica.fraunhofer.de/ise/2015-conference.htm
    https://www.eupvsec.org/images/programbrochures/2015_Programme_Catalogue.pdf

    Conference

    Conference31st European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2015
    Abbreviated titleEU PVSEC 2015
    Country/TerritoryGermany
    CityHamburg
    Period14/09/1518/09/15
    Internet address

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