Identification by photoluminescence and positron annihilation of vacancy and interstitial intrinsic defects in ion-implanted silicon
- R. Harding
- , G. Davies*
- , J. Tan
- , P. G. Coleman
- , C. P. Burrows
- , J. Wong-Leung
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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