TY - GEN
T1 - Image inpainting based on local optimisation
AU - Zhou, Jun
AU - Robles-Kelly, Antonio
PY - 2010
Y1 - 2010
N2 - In this paper, we tackle the problem of image inpainting which aims at removing objects from an image or repairing damaged pictures by replacing the missing regions using the information in the rest of the scene. The image inpainting method proposed here builds on an exemplar-based perspective so as to improve the local consistency of the inpainted region. This is done by selecting the optimal patch which maximises the local consistency with respect to abutting candidate patches. The similarity computation generates weights based upon an edge prior and the structural differences between inpainting exemplar candidates. This treatment permits the generation of an inpainting sequence based on a list of factors. The experiments show that the proposed method delivers a margin of improvement as compared to alternative methods.
AB - In this paper, we tackle the problem of image inpainting which aims at removing objects from an image or repairing damaged pictures by replacing the missing regions using the information in the rest of the scene. The image inpainting method proposed here builds on an exemplar-based perspective so as to improve the local consistency of the inpainted region. This is done by selecting the optimal patch which maximises the local consistency with respect to abutting candidate patches. The similarity computation generates weights based upon an edge prior and the structural differences between inpainting exemplar candidates. This treatment permits the generation of an inpainting sequence based on a list of factors. The experiments show that the proposed method delivers a margin of improvement as compared to alternative methods.
UR - http://www.scopus.com/inward/record.url?scp=78149475602&partnerID=8YFLogxK
U2 - 10.1109/ICPR.2010.1078
DO - 10.1109/ICPR.2010.1078
M3 - Conference contribution
SN - 9780769541099
T3 - Proceedings - International Conference on Pattern Recognition
SP - 4440
EP - 4443
BT - Proceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010
T2 - 2010 20th International Conference on Pattern Recognition, ICPR 2010
Y2 - 23 August 2010 through 26 August 2010
ER -