Impact of laterally non-uniform carrier lifetime on photoconductance-based lifetime measurements with self-consistent calibration

W. S. Liang*, Klaus J. Weber, Y. L. Ren

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    3 Citations (Scopus)

    Abstract

    The impact of laterally non-uniform carrier lifetime on the determination of the lifetime from photoconductance-based measurements, based on the self-consistent method proposed by Trupke and Bardos, is investigated using a simple model. It is shown that the method can result in an overestimation of the mean lifetime, with the magnitude of the error mainly dependent on the distribution of the effective lifetime across the area sensed by the photoconductance coil. Although in many cases the error introduced will be relatively small (in the order of 5% or less), much larger errors can result in some cases, such as for samples that feature small areas with a significantly higher than average lifetime. The error can be eliminated through independent measurement of the sample optical properties. Experimental measurements confirm the model predictions.

    Original languageEnglish
    Pages (from-to)1640-1644
    Number of pages5
    JournalProgress in Photovoltaics: Research and Applications
    Volume21
    Issue number8
    DOIs
    Publication statusPublished - Dec 2013

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