Improved 3D imaging performance of MPC

M. S. Rana, H. R. Pota, I. R. Petersen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)


Since its introduction, the atomic force microscope (AFM) has developed into a ubiquitous tool for 3D imaging and manipulating objects at a nanoscale level. However, the imaging performance of AFMs is limited because of the limitations of its scanning unit, i.e., piezoelectric tube scanner (PTS). This paper addresses the design and experimental implementation of a two-input two-output (TITO) model predictive control (MPC) scheme which aims to overcome the limiting factors of the PTS in order to achieve improved 3D images. The effectiveness of the proposed method is experimentally compared with the existing AFM proportional-integral (PI) controller, the resonant controller, and the single-input single-output (SISO) MPC controller.

Original languageEnglish
Title of host publication54rd IEEE Conference on Decision and Control,CDC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages6
ISBN (Electronic)9781479978861
Publication statusPublished - 8 Feb 2015
Externally publishedYes
Event54th IEEE Conference on Decision and Control, CDC 2015 - Osaka, Japan
Duration: 15 Dec 201518 Dec 2015

Publication series

NameProceedings of the IEEE Conference on Decision and Control
Volume54rd IEEE Conference on Decision and Control,CDC 2015
ISSN (Print)0743-1546
ISSN (Electronic)2576-2370


Conference54th IEEE Conference on Decision and Control, CDC 2015


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