@inproceedings{b8e289059be7425bb6ed57648c6c48ad,
title = "Improved 3D imaging performance of MPC",
abstract = "Since its introduction, the atomic force microscope (AFM) has developed into a ubiquitous tool for 3D imaging and manipulating objects at a nanoscale level. However, the imaging performance of AFMs is limited because of the limitations of its scanning unit, i.e., piezoelectric tube scanner (PTS). This paper addresses the design and experimental implementation of a two-input two-output (TITO) model predictive control (MPC) scheme which aims to overcome the limiting factors of the PTS in order to achieve improved 3D images. The effectiveness of the proposed method is experimentally compared with the existing AFM proportional-integral (PI) controller, the resonant controller, and the single-input single-output (SISO) MPC controller.",
keywords = "Electron tubes, Frequency measurement, Hysteresis, Imaging, Mathematical model, Three-dimensional displays, Yttrium",
author = "Rana, {M. S.} and Pota, {H. R.} and Petersen, {I. R.}",
note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 54th IEEE Conference on Decision and Control, CDC 2015 ; Conference date: 15-12-2015 Through 18-12-2015",
year = "2015",
month = feb,
day = "8",
doi = "10.1109/CDC.2015.7403381",
language = "English",
series = "Proceedings of the IEEE Conference on Decision and Control",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "7359--7364",
booktitle = "54rd IEEE Conference on Decision and Control,CDC 2015",
address = "United States",
}