Improved control of atomic force microscope for high-speed image scanning

M. S. Rana, H. R. Pota, I. R. Petersen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Citations (Scopus)

Abstract

In this paper the design and experimental implementation of an observer based model predictive control (OMPC) scheme for accurate tracking and fast scanning of an atomic force microscope (AFM) is presented. The design of this controller is based on an identified model of the AFM piezoelectric tube (PZT) scanner. A Kalman filter is used to obtain full-state information in the presence of position sensor noise. To evaluate the performance improvement using the proposed control scheme an experimental comparison has been made with scanned images between the proposed controller and the existing AFM PI controller. The experimental results verify the efficacy of the proposed controller.

Original languageEnglish
Title of host publication2012 2nd Australian Control Conference, AUCC 2012
PublisherIEEE Computer Society
Pages470-475
Number of pages6
ISBN (Print)9781922107633
Publication statusPublished - 2012
Externally publishedYes
Event2nd Australian Control Conference, AUCC 2012 - Sydney, NSW, Australia
Duration: 15 Nov 201216 Nov 2012

Publication series

Name2012 2nd Australian Control Conference, AUCC 2012

Conference

Conference2nd Australian Control Conference, AUCC 2012
Country/TerritoryAustralia
CitySydney, NSW
Period15/11/1216/11/12

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