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Improved thermal and electrical properties of Al-doped Ge 2Sb 2Te 5 films for phase-change random access memory
Guoxiang Wang, Xiang Shen, Qiuhua Nie*, Rongping Wang, Liangcai Wu, Yegang Lv, Fen Chen, Jing Fu, Shixun Dai, Jun Li
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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