Improvement of the tracking accuracy of an AFM using MPC

M. S. Rana, H. R. Pota, I. R. Petersen, Habibullah

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Citations (Scopus)

Abstract

Tracking a reference signal is one of the major problems of an atomic force microscope (AFM). This article presents the design and experimental implementation of a model predictive control (MPC) scheme, with a vibration compensator for achieving accurate tracking for an AFM at higher scanning rates. To evaluate the improvement in performance attained by this control scheme, an experimental comparison of its tracked signals against different reference signals at different scanning rates is conducted. The experimental results demonstrate the effectiveness of the proposed controller.

Original languageEnglish
Title of host publicationProceedings of the 2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013
Pages1681-1686
Number of pages6
DOIs
Publication statusPublished - 2013
Externally publishedYes
Event2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013 - Melbourne, VIC, Australia
Duration: 19 Jun 201321 Jun 2013

Publication series

NameProceedings of the 2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013

Conference

Conference2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013
Country/TerritoryAustralia
CityMelbourne, VIC
Period19/06/1321/06/13

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