In-Situ Single-Photon Detection of Er Sites in Si

Ian R. Berkman*, Alexey Lyasota, Gabriele G. de Boo, John G. Bartholomew, Brett C. Johnson, Jeffrey C. McCallum, Bin Bin Xu, Shouyi Xie, Rose L. Ahlefeldt, Matthew J. Sellars, Chunming Yin, Sven Rogge

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    Using sample-on-SSPD and photoluminescence excitation spectroscopy, we demonstrate Er sites in Si with inhomogeneous broadening below 100 MHz, a 350 kHz upper bound on the homogeneous linewidth, and electron T1 lower bound of 1 second.

    Original languageEnglish
    Title of host publication2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Electronic)9781957171050
    Publication statusPublished - 2022
    Event2022 Conference on Lasers and Electro-Optics, CLEO 2022 - San Jose, United States
    Duration: 15 May 202220 May 2022

    Publication series

    Name2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings

    Conference

    Conference2022 Conference on Lasers and Electro-Optics, CLEO 2022
    Country/TerritoryUnited States
    CitySan Jose
    Period15/05/2220/05/22

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