In-situ XTEM Analysis of the Liquid Phase Epitaxial Growth of a-Si/Au alloy layer

D. K. Venkatachalam, D. J. Llewellyn, K. B. Belay, R. G. Elliman, D. K. Sood, S. K. Bhargava

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1338-1339
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608086479
Publication status	Published - Aug 2008

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title = "In-situ XTEM Analysis of the Liquid Phase Epitaxial Growth of a-Si/Au alloy layer",

author = "Venkatachalam, \{D. K.\} and Llewellyn, \{D. J.\} and Belay, \{K. B.\} and Elliman, \{R. G.\} and Sood, \{D. K.\} and Bhargava, \{S. K.\}",

year = "2008",

month = aug,

doi = "10.1017/S1431927608086479",

language = "English",

volume = "14",

pages = "1338--1339",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press ",

number = "SUPPL. 2",

}

TY - JOUR

T1 - In-situ XTEM Analysis of the Liquid Phase Epitaxial Growth of a-Si/Au alloy layer

AU - Venkatachalam, D. K.

AU - Llewellyn, D. J.

AU - Belay, K. B.

AU - Elliman, R. G.

AU - Sood, D. K.

AU - Bhargava, S. K.

PY - 2008/8

Y1 - 2008/8

UR - https://www.scopus.com/pages/publications/49549095766

U2 - 10.1017/S1431927608086479

DO - 10.1017/S1431927608086479

M3 - Article

SN - 1431-9276

VL - 14

SP - 1338

EP - 1339

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -