Indentation-induced damage in GaN epilayers

J. E. Bradby, S. O. Kucheyev, J. S. Williams, J. Wong-Leung, M. V. Swain, P. Munroe, G. Li, M. R. Phillips

    Research output: Contribution to journal › Article › peer-review

    101 Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'Indentation-induced damage in GaN epilayers'. Together they form a unique fingerprint.

    Material Science