TY - GEN
T1 - Indoor scene structure analysis for single image depth estimation
AU - Zhuo, Wei
AU - Salzmann, Mathieu
AU - He, Xuming
AU - Liu, Miaomiao
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/10/14
Y1 - 2015/10/14
N2 - We tackle the problem of single image depth estimation, which, without additional knowledge, suffers from many ambiguities. Unlike previous approaches that only reason locally, we propose to exploit the global structure of the scene to estimate its depth. To this end, we introduce a hierarchical representation of the scene, which models local depth jointly with mid-level and global scene structures. We formulate single image depth estimation as inference in a graphical model whose edges let us encode the interactions within and across the different layers of our hierarchy. Our method therefore still produces detailed depth estimates, but also leverages higher-level information about the scene. We demonstrate the benefits of our approach over local depth estimation methods on standard indoor datasets.
AB - We tackle the problem of single image depth estimation, which, without additional knowledge, suffers from many ambiguities. Unlike previous approaches that only reason locally, we propose to exploit the global structure of the scene to estimate its depth. To this end, we introduce a hierarchical representation of the scene, which models local depth jointly with mid-level and global scene structures. We formulate single image depth estimation as inference in a graphical model whose edges let us encode the interactions within and across the different layers of our hierarchy. Our method therefore still produces detailed depth estimates, but also leverages higher-level information about the scene. We demonstrate the benefits of our approach over local depth estimation methods on standard indoor datasets.
UR - http://www.scopus.com/inward/record.url?scp=84959245228&partnerID=8YFLogxK
U2 - 10.1109/CVPR.2015.7298660
DO - 10.1109/CVPR.2015.7298660
M3 - Conference contribution
T3 - Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
SP - 614
EP - 622
BT - IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2015
PB - IEEE Computer Society
T2 - IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2015
Y2 - 7 June 2015 through 12 June 2015
ER -