Influence of annealing and bulk hydrogenation on lifetime-limiting defects in nitrogen-doped floating zone silicon

Material Science

• Silicon 100%
• Hydrogenation 100%
• Silicon Wafer 50%
• Annealing 50%
• Carrier Lifetime 50%
• Photoluminescence 50%
• Secondary Ion Mass Spectrometry 50%
• Mass Spectrometry 50%
• Point Defect 50%

Engineering

• Defects 100%
• Hydrogenation 100%
• Floating Zone 100%
• Silicon Wafer 25%
• Carrier Lifetime 25%
• Minority Carriers 25%
• Lifetime Measurement 25%
• Recombination Centre 25%
• Intrinsic Point Defect 25%