Influence of cap layer on implantation induced interdiffusion in InP/InGaAs quantum wells

C. Carmody*, H. H. Tan, C. Jagadish

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    15 Citations (Scopus)

    Abstract

    The effect of implantation induced interdiffusion in InP and InGaAs quantum well structures was investigated. In InP capped sample, the implant temperature affected the dose dependent evolution of shifts in photoluminescence energy. The InP capped sample was seen as more sensitive to the implant temperature than the InGaAs sample.

    Original languageEnglish
    Pages (from-to)4468-4470
    Number of pages3
    JournalJournal of Applied Physics
    Volume93
    Issue number8
    DOIs
    Publication statusPublished - 15 Apr 2003

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