Influence of the NH3:SiH4 ratio and surface morphology on the surface passivation of phosphorus-diffused C-Si by PECVD SiNx

Yimao Wan, Di Yan, Andres Cuevas, Keith R. McIntosh

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    4 Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'Influence of the NH3:SiH4 ratio and surface morphology on the surface passivation of phosphorus-diffused C-Si by PECVD SiNx'. Together they form a unique fingerprint.

    Engineering

    Material Science

    Immunology and Microbiology