Injection optics for fast mass switching for accelerator mass spectrometry

D. C. Weisser*, L. K. Fifield, M. De Cesare, S. G. Tims, N. R. Lobanov, G. G. Crook, D. Tsifakis, T. B. Tunningley

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    4 Citations (Scopus)


    Accelerator Mass Spectrometry (AMS) measures the ratio of extremely small amounts of a radioactive isotope in the presence of ∼ 1015 times more stable ones. The isotopes are injected sequentially over a repeated period and observed at the exit of the accelerator. so any fluctuations in ion source output or transmission through the accelerator over a time comparable to the measurement time, will reduce the accuracy of such measurements. This compromise in accuracy can be lessened by reducing the switching time between isotopes from several seconds to a few milli-seconds. New AMS systems accomplish fast switching by modifying the beam energy though the 90 injection magnet by pulsing the voltage by several kV on the flight tube in the magnet. That requires that the flight tube be electrically insulated which competes with having the flight tube as large as possible. At the ANU, insulating the magnet flight tube would not only have reduced the acceptance of the injection system, but conflicted with a beam chopper attached to the flight tube, that would also have had to be insulated from the ground. This was not practical so the novel alternative of pulsing the voltage on the high voltage ion source deck is being implemented. Beam optics calculations have been performed and beam tests conducted that demonstrated that, in addition to pulsing the voltage on the 150 kV ion source deck, a pulsed Einzel lens in front of the following electrostatic quadrupole triplet lens is required to maintain isotope-independent transmission through the 14UD Pelletron accelerator. The high voltage rise time performance of the components of the system has been shown to be satisfactory.

    Original languageEnglish
    Title of host publicationThird International Symposium on Negative Ions, Beams and Sources, NIBS 2012
    Number of pages9
    Publication statusPublished - 2013
    Event3rd International Symposium on Negative Ions, Beams and Sources, NIBS 2012 - Jyvaskyla, Finland
    Duration: 3 Sept 20127 Sept 2012

    Publication series

    NameAIP Conference Proceedings
    ISSN (Print)0094-243X
    ISSN (Electronic)1551-7616


    Conference3rd International Symposium on Negative Ions, Beams and Sources, NIBS 2012


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