Introduction to X-ray absorption spectroscopy

Claudia S. Schnohr*, Mark C. Ridgway

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    5 Citations (Scopus)

    Abstract

    X-ray Absorption Spectroscopy (XAS) is a well-established analytical technique used extensively for the characterization of semiconductors in solid or liquid, crystalline or amorphous, bulk or nanoscale form. With this chapter, we provide a brief introduction to XAS, covering both theory and experiment, while we refer to more comprehensive texts for greater detail about this continually evolving technique. The chapter thus is a starting point upon which subsequent chapters build as they demonstrate the broad-ranging applications of XAS to semiconductors materials.

    Original languageEnglish
    JournalSpringer Series in Optical Sciences
    Volume190
    DOIs
    Publication statusPublished - 2015

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