Introduction to X-ray absorption spectroscopy

Claudia S. Schnohr; Mark C. Ridgway

doi:10.1007/978-3-662-44362-0_1

Introduction to X-ray absorption spectroscopy

Claudia S. Schnohr^*, Mark C. Ridgway

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

X-ray Absorption Spectroscopy (XAS) is a well-established analytical technique used extensively for the characterization of semiconductors in solid or liquid, crystalline or amorphous, bulk or nanoscale form. With this chapter, we provide a brief introduction to XAS, covering both theory and experiment, while we refer to more comprehensive texts for greater detail about this continually evolving technique. The chapter thus is a starting point upon which subsequent chapters build as they demonstrate the broad-ranging applications of XAS to semiconductors materials.

Original language	English
Journal	Springer Series in Optical Sciences
Volume	190
DOIs	https://doi.org/10.1007/978-3-662-44362-0_1
Publication status	Published - 2015

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title = "Introduction to X-ray absorption spectroscopy",

abstract = "X-ray Absorption Spectroscopy (XAS) is a well-established analytical technique used extensively for the characterization of semiconductors in solid or liquid, crystalline or amorphous, bulk or nanoscale form. With this chapter, we provide a brief introduction to XAS, covering both theory and experiment, while we refer to more comprehensive texts for greater detail about this continually evolving technique. The chapter thus is a starting point upon which subsequent chapters build as they demonstrate the broad-ranging applications of XAS to semiconductors materials.",

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journal = "Springer Series in Optical Sciences",

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N2 - X-ray Absorption Spectroscopy (XAS) is a well-established analytical technique used extensively for the characterization of semiconductors in solid or liquid, crystalline or amorphous, bulk or nanoscale form. With this chapter, we provide a brief introduction to XAS, covering both theory and experiment, while we refer to more comprehensive texts for greater detail about this continually evolving technique. The chapter thus is a starting point upon which subsequent chapters build as they demonstrate the broad-ranging applications of XAS to semiconductors materials.

AB - X-ray Absorption Spectroscopy (XAS) is a well-established analytical technique used extensively for the characterization of semiconductors in solid or liquid, crystalline or amorphous, bulk or nanoscale form. With this chapter, we provide a brief introduction to XAS, covering both theory and experiment, while we refer to more comprehensive texts for greater detail about this continually evolving technique. The chapter thus is a starting point upon which subsequent chapters build as they demonstrate the broad-ranging applications of XAS to semiconductors materials.

UR - https://www.scopus.com/pages/publications/84921468520

U2 - 10.1007/978-3-662-44362-0_1

DO - 10.1007/978-3-662-44362-0_1

M3 - Article

AN - SCOPUS:84921468520

SN - 0342-4111

VL - 190

JO - Springer Series in Optical Sciences

JF - Springer Series in Optical Sciences

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Introduction to X-ray absorption spectroscopy

Abstract

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