Ion beam modification of thermal stress resistance of MgO single crystals with different crystallographic faces

V. N. Gurarie*, P. H. Otsuka, J. S. Williams, M. J. Conway

*Corresponding author for this work

    Research output: Contribution to journalConference articlepeer-review

    4 Citations (Scopus)

    Abstract

    Ion beam modification of thermal shock stress resistance of MgO single crystals with various crystallographic faces is investigated. The most stable crystal faces in terms of stress and damage resistance are established. Ion implantation is shown to reduce the temperature threshold of fracture for all crystal faces tested. The (1 1 1) face is demonstrated to be of highest stability compared to (1 1 0) and (1 0 0) faces in both implanted and unimplanted crystals. At the same time ion implantation substantially increases the microcrack density for all the faces tested and reduces the degree of fracture damage following thermal shock. The theoretical resistance parameters for various crystal faces are calculated using the continuum mechanics approach. The results are discussed on the basis of fracture mechanics principles and the effect of the implantation-induced lattice damage on crack nucleation.

    Original languageEnglish
    Pages (from-to)138-143
    Number of pages6
    JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
    Volume178
    Issue number1-4
    DOIs
    Publication statusPublished - May 2001
    EventMaterials Science with Ion Beams - Strasbourg, France
    Duration: 30 May 20002 Jun 2000

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