Isotextured silicon solar cell analysis and modeling 2: Recombination and device modeling

Simeon C. Baker-Finch*, Keith R. McIntosh, Mason L. Terry, Yimao Wan

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    25 Citations (Scopus)

    Abstract

    We extend our analysis of isotextured silicon solar cells by 1) examining experimentally the role played by isotexture in determining the surface recombination velocity at silicon surfaces and 2) combining these experimental results with our model for photogeneration in order to simulate in one dimension typical solar cell devices with isotextured surfaces. We examine both undiffused and diffused n-type isotextured silicon surfaces, and we find that the rate of surface recombination usually decreases with increasing isotexture etch depth. However, when undiffused surfaces are passivated with hydrogenated SiO 2or SiN x , surface recombination velocity is, counterintuitively perhaps, found to be independent of surface texturethis is despite a surface area that is up to 1.9-fold larger than a planar equivalent. We demonstrate the utility of our analysis of isotextured surfaces by simulating various device structures in one dimension. In one case, where device parameters are chosen to approximate a typical screen-printed cell with full-area back surface field, simulation results indicate that the optimal isotexture etch depth is 1-3μm. This optimum etch depth is slightly below the one deduced from published experimental results, indicating that surface recombination on samples observed in this study is uniquely independent of isotexture morphology.

    Original languageEnglish
    Article number6235972
    Pages (from-to)465-472
    Number of pages8
    JournalIEEE Journal of Photovoltaics
    Volume2
    Issue number4
    DOIs
    Publication statusPublished - 2012

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