Isotropic Pinning Enhancement: Comparison between Spherical and Point Defects

Arya Ambadiyil Soman, Nicholas J. Long*, Stuart C. Wimbush, Jerome Leveneur, John Kennedy, Christian Notthoff, Patrick Kluth, Martin W. Rupich, Nicholas M. Strickland

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    Abstract

    We have used silver-ion irradiation and proton irradiation to produce point-like and spherical defects in REBa2Cu3O7 coated conductors. We compare the resulting pinning landscape for optimized fluences and show that proton irradiation gives a slightly greater pinning enhancement at 20 K, but in the same samples silver irradiation gives significantly better pinning enhancement at 65 K. We attribute this to the relative sizes of the defects and to the distribution of defects resulting from the different ion collision rates.

    Original languageEnglish
    Article number8000405
    Pages (from-to)1-5
    Number of pages5
    JournalIEEE Transactions on Applied Superconductivity
    Volume34
    Issue number3
    DOIs
    Publication statusPublished - 1 May 2024

    Fingerprint

    Dive into the research topics of 'Isotropic Pinning Enhancement: Comparison between Spherical and Point Defects'. Together they form a unique fingerprint.

    Cite this