Joint discriminative Bayesian dictionary and classifier learning

Naveed Akhtar, Ajmal Mian, Fatih Porikli

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    25 Citations (Scopus)

    Abstract

    We propose to jointly learn a Discriminative Bayesian dictionary along a linear classifier using coupled Beta-Bernoulli Processes. Our representation model uses separate base measures for the dictionary and the classifier, but associates them to the class-specific training data using the same Bernoulli distributions. The Bernoulli distributions control the frequency with which the factors (e.g. dictionary atoms) are used in data representations, and they are inferred while accounting for the class labels in our approach. To further encourage discrimination in the dictionary, our model uses separate (sets of) Bernoulli distributions to represent data from different classes. Our approach adaptively learns the association between the dictionary atoms and the class labels while tailoring the classifier to this relation with a joint inference over the dictionary and the classifier. Once a test sample is represented over the dictionary, its representation is accurately labeled by the classifier due to the strong coupling between the dictionary and the classifier. We derive the Gibbs Sampling equations for our joint representation model and test our approach for face, object, scene and action recognition to establish its effectiveness.

    Original languageEnglish
    Title of host publicationProceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages3919-3928
    Number of pages10
    ISBN (Electronic)9781538604571
    DOIs
    Publication statusPublished - 6 Nov 2017
    Event30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017 - Honolulu, United States
    Duration: 21 Jul 201726 Jul 2017

    Publication series

    NameProceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
    Volume2017-January

    Conference

    Conference30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
    Country/TerritoryUnited States
    CityHonolulu
    Period21/07/1726/07/17

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