Kinetics of Bulk Lifetime Degradation in Float-Zone Silicon: Fast Activation and Annihilation of Grown-In Defects and the Role of Hydrogen versus Light
Daniel Hiller*, Vladimir P. Markevich, Joyce Ann T. de Guzman, Dirk König, Slawomir Prucnal, Wolfgang Bock, Jaakko Julin, Anthony R. Peaker, Daniel Macdonald, Nicholas E. Grant, John D. Murphy
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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