Kondo-like behavior in ThAsSe and UAsSe

J. Schoenes; R. L. Withers; F. Hulliger

doi:10.1016/j.jmmm.2006.10.672

Kondo-like behavior in ThAsSe and UAsSe

J. Schoenes^*, R. L. Withers, F. Hulliger

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

Diamagnetic ThAsSe and ferromagnetic UAsSe display negative temperature coefficients of the electrical resistivity over extended temperature ranges. Electron-diffraction studies show that As-As dimerizations within the As layers cause this Kondo-like behavior in ThAsSe and do also contribute in UAsSe. We suggest that a coupling between neighboring As layers at the lowest temperatures may be at the origin of a second Kondo-like regime below ≈15 K.

Original language	English
Pages (from-to)	1778-1780
Number of pages	3
Journal	Journal of Magnetism and Magnetic Materials
Volume	310
Issue number	2 SUPPL. PART 2
DOIs	https://doi.org/10.1016/j.jmmm.2006.10.672
Publication status	Published - Mar 2007

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title = "Kondo-like behavior in ThAsSe and UAsSe",

abstract = "Diamagnetic ThAsSe and ferromagnetic UAsSe display negative temperature coefficients of the electrical resistivity over extended temperature ranges. Electron-diffraction studies show that As-As dimerizations within the As layers cause this Kondo-like behavior in ThAsSe and do also contribute in UAsSe. We suggest that a coupling between neighboring As layers at the lowest temperatures may be at the origin of a second Kondo-like regime below ≈15 K.",

keywords = "Actinides, Dimerization, Kondo effect, Superstructures",

author = "J. Schoenes and Withers, {R. L.} and F. Hulliger",

year = "2007",

month = mar,

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T1 - Kondo-like behavior in ThAsSe and UAsSe

AU - Schoenes, J.

AU - Withers, R. L.

AU - Hulliger, F.

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N2 - Diamagnetic ThAsSe and ferromagnetic UAsSe display negative temperature coefficients of the electrical resistivity over extended temperature ranges. Electron-diffraction studies show that As-As dimerizations within the As layers cause this Kondo-like behavior in ThAsSe and do also contribute in UAsSe. We suggest that a coupling between neighboring As layers at the lowest temperatures may be at the origin of a second Kondo-like regime below ≈15 K.

AB - Diamagnetic ThAsSe and ferromagnetic UAsSe display negative temperature coefficients of the electrical resistivity over extended temperature ranges. Electron-diffraction studies show that As-As dimerizations within the As layers cause this Kondo-like behavior in ThAsSe and do also contribute in UAsSe. We suggest that a coupling between neighboring As layers at the lowest temperatures may be at the origin of a second Kondo-like regime below ≈15 K.

KW - Actinides

KW - Dimerization

KW - Kondo effect

KW - Superstructures

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U2 - 10.1016/j.jmmm.2006.10.672

DO - 10.1016/j.jmmm.2006.10.672

M3 - Article

SN - 0304-8853

VL - 310

SP - 1778

EP - 1780

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

IS - 2 SUPPL. PART 2

ER -

Kondo-like behavior in ThAsSe and UAsSe

Abstract

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