Abstract
This work demonstrates, for the first time, a tantalum oxide/silicon nitride (Ta2O5/SiNx) stack as a combined passivation and antireflection coating deposited on the boron-diffused front surface of n-type silicon solar cells. Due to the high chemical resistance of Ta2O5, the patterning of the films is realized via picosecond laser ablation, followed by a field-induced metal plating of nickel and copper to form the front metal grid electrode. A solar cell conversion efficiency of 19.3% is achieved, and further improvements are anticipated from the optimization of the laser ablation process and the tuning of the thickness of the individual layers of the dielectric stack.
Original language | English |
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Article number | 1700187 |
Journal | Solar RRL |
Volume | 2 |
Issue number | 2 |
DOIs | |
Publication status | Published - 1 Feb 2018 |