Latent ion tracks in amorphous silicon

T. Bierschenk*, R. Giulian, B. Afra, M. D. Rodriguez, D. Schauries, S. Mudie, O. H. Pakarinen, F. Djurabekova, K. Nordlund, O. Osmani, N. Medvedev, B. Rethfeld, M. C. Ridgway, P. Kluth

*Corresponding author for this work

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