TY - GEN
T1 - Local Background Enclosure for RGB-D Salient Object Detection
AU - Feng, David
AU - Barnes, Nick
AU - You, Shaodi
AU - McCarthy, Chris
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/12/9
Y1 - 2016/12/9
N2 - Recent work in salient object detection has considered the incorporation of depth cues from RGB-D images. In most cases, depth contrast is used as the main feature. However, areas of high contrast in background regions cause false positives for such methods, as the background frequently contains regions that are highly variable in depth. Here, we propose a novel RGB-D saliency feature. Local Background Enclosure (LBE) captures the spread of angular directions which are background with respect to the candidate region and the object that it is part of. We show that our feature improves over state-of-the-art RGB-D saliency approaches as well as RGB methods on the RGBD1000 and NJUDS2000 datasets.
AB - Recent work in salient object detection has considered the incorporation of depth cues from RGB-D images. In most cases, depth contrast is used as the main feature. However, areas of high contrast in background regions cause false positives for such methods, as the background frequently contains regions that are highly variable in depth. Here, we propose a novel RGB-D saliency feature. Local Background Enclosure (LBE) captures the spread of angular directions which are background with respect to the candidate region and the object that it is part of. We show that our feature improves over state-of-the-art RGB-D saliency approaches as well as RGB methods on the RGBD1000 and NJUDS2000 datasets.
UR - http://www.scopus.com/inward/record.url?scp=84986329543&partnerID=8YFLogxK
U2 - 10.1109/CVPR.2016.257
DO - 10.1109/CVPR.2016.257
M3 - Conference contribution
T3 - Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
SP - 2343
EP - 2350
BT - Proceedings - 29th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016
PB - IEEE Computer Society
T2 - 29th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016
Y2 - 26 June 2016 through 1 July 2016
ER -