TY - GEN
T1 - Location specific PV yield and loss simulation based on module stack and layout
AU - Thomson, Andrew
AU - Ernst, Marco
AU - Haedrich, Ingrid
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/8/17
Y1 - 2016/8/17
N2 - PV cell and module manufactures optimise their products according to standard test conditions. The key parameter for financing of a solar farm is yield under field or realistic conditions. Field testing modules is expensive and time consuming. Hence we develop a methodology for simulating PV module yield based on the optical, thermal and electrical properties of the components and their stack ands layout. With our procedure we will model optical, thermal and electrical losses under realistic conditions for standard, half cell and encapsulant free modules in different locations. For now we quantify the losses for a standard module installed in Melbourne on a cloudy day. The largest loss factor is electrical, as the module voltage decreases with low irradiance.
AB - PV cell and module manufactures optimise their products according to standard test conditions. The key parameter for financing of a solar farm is yield under field or realistic conditions. Field testing modules is expensive and time consuming. Hence we develop a methodology for simulating PV module yield based on the optical, thermal and electrical properties of the components and their stack ands layout. With our procedure we will model optical, thermal and electrical losses under realistic conditions for standard, half cell and encapsulant free modules in different locations. For now we quantify the losses for a standard module installed in Melbourne on a cloudy day. The largest loss factor is electrical, as the module voltage decreases with low irradiance.
UR - http://www.scopus.com/inward/record.url?scp=84987662385&partnerID=8YFLogxK
U2 - 10.1109/NUSOD.2016.7547084
DO - 10.1109/NUSOD.2016.7547084
M3 - Conference contribution
T3 - 16th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2016
SP - 163
EP - 164
BT - 16th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2016
A2 - de Sterke, Martijn
A2 - Poulton, Christopher
A2 - Piprek, Joachim
A2 - Steel, Michael
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 16th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2016
Y2 - 11 July 2016 through 15 July 2016
ER -