Location specific PV yield and loss simulation based on module stack and layout

Andrew Thomson, Marco Ernst, Ingrid Haedrich

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    PV cell and module manufactures optimise their products according to standard test conditions. The key parameter for financing of a solar farm is yield under field or realistic conditions. Field testing modules is expensive and time consuming. Hence we develop a methodology for simulating PV module yield based on the optical, thermal and electrical properties of the components and their stack ands layout. With our procedure we will model optical, thermal and electrical losses under realistic conditions for standard, half cell and encapsulant free modules in different locations. For now we quantify the losses for a standard module installed in Melbourne on a cloudy day. The largest loss factor is electrical, as the module voltage decreases with low irradiance.

    Original languageEnglish
    Title of host publication16th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2016
    EditorsMartijn de Sterke, Christopher Poulton, Joachim Piprek, Michael Steel
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages163-164
    Number of pages2
    ISBN (Electronic)9781467386036
    DOIs
    Publication statusPublished - 17 Aug 2016
    Event16th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2016 - Sydney, Australia
    Duration: 11 Jul 201615 Jul 2016

    Publication series

    Name16th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2016

    Conference

    Conference16th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2016
    Country/TerritoryAustralia
    CitySydney
    Period11/07/1615/07/16

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