@inproceedings{901f683abdd34fa29c004ca7d9d4a3ce,
title = "Location specific PV yield and loss simulation based on module stack and layout",
abstract = "PV cell and module manufactures optimise their products according to standard test conditions. The key parameter for financing of a solar farm is yield under field or realistic conditions. Field testing modules is expensive and time consuming. Hence we develop a methodology for simulating PV module yield based on the optical, thermal and electrical properties of the components and their stack ands layout. With our procedure we will model optical, thermal and electrical losses under realistic conditions for standard, half cell and encapsulant free modules in different locations. For now we quantify the losses for a standard module installed in Melbourne on a cloudy day. The largest loss factor is electrical, as the module voltage decreases with low irradiance.",
author = "Andrew Thomson and Marco Ernst and Ingrid Haedrich",
note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 16th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2016 ; Conference date: 11-07-2016 Through 15-07-2016",
year = "2016",
month = aug,
day = "17",
doi = "10.1109/NUSOD.2016.7547084",
language = "English",
series = "16th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2016",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "163--164",
editor = "\{de Sterke\}, Martijn and Christopher Poulton and Joachim Piprek and Michael Steel",
booktitle = "16th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2016",
address = "United States",
}