Low energy ion scattering as a probe of neon radiation damage in nickel

S. E. Donnelly*, R. G. Elliman, D. J. O'Connor, R. J. MacDonald

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

The channelling of low energy (keV) hydrogen ions in double alignment geometry has been used to probe damage induced in a (110) nickel specimen by low energy neon irradiation. The channelling spectra, which exhibit a clear surface peak. yield information on both surface and near-surface radiation damage. We present results on sub-surface damage build up, as a function of fluence at different neon energies, which clearly indicate sensitivity to damage level and depth. Asymmetries observed in ion yields along crystallographically equivalent direction are discussed in terms of possible damage configurations.

Original languageEnglish
Pages (from-to)130-133
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume15
Issue number1-6
DOIs
Publication statusPublished - 1 Apr 1986
Externally publishedYes

Fingerprint

Dive into the research topics of 'Low energy ion scattering as a probe of neon radiation damage in nickel'. Together they form a unique fingerprint.

Cite this