Making deep neural networks robust to label noise: A loss correction approach

Giorgio Patrini, Alessandro Rozza, Aditya Krishna Menon, Richard Nock, Lizhen Qu

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    954 Citations (Scopus)

    Abstract

    We present a theoretically grounded approach to train deep neural networks, including recurrent networks, subject to class-dependent label noise. We propose two procedures for loss correction that are agnostic to both application domain and network architecture. They simply amount to at most a matrix inversion and multiplication, provided that we know the probability of each class being corrupted into another. We further show how one can estimate these probabilities, adapting a recent technique for noise estimation to the multi-class setting, and thus providing an end-to-end framework. Extensive experiments on MNIST, IMDB, CIFAR-10, CIFAR-100 and a large scale dataset of clothing images employing a diversity of architectures - stacking dense, convolutional, pooling, dropout, batch normalization, word embedding, LSTM and residual layers - demonstrate the noise robustness of our proposals. Incidentally, we also prove that, when ReLU is the only non-linearity, the loss curvature is immune to class-dependent label noise.

    Original languageEnglish
    Title of host publicationProceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages2233-2241
    Number of pages9
    ISBN (Electronic)9781538604571
    DOIs
    Publication statusPublished - 6 Nov 2017
    Event30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017 - Honolulu, United States
    Duration: 21 Jul 201726 Jul 2017

    Publication series

    NameProceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
    Volume2017-January

    Conference

    Conference30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
    Country/TerritoryUnited States
    CityHonolulu
    Period21/07/1726/07/17

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