Mapping optical process in semiconductor nanowires using dynamic optical tweezers

Fan Wang*, Wen Jun Toe, Alexander Hartstone, Woei Ming Lee, David McGloin, Qiang Gao, Hark Hoe Tan, Chennupati Jagadish, Peter J. Reece

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    We present a novel method for spatial mapping of the luminescent properties of single optically trapped semiconductor nanowires by combing dynamic optical tweezers with micro-photoluminescence. The technique involves the use of a spatial light modulator (SLM) to control the axial position of the trapping focus relative to the excitation source and collection optics. When a nanowire is held in this arrangement, scanning the axial position of the trapping beam enables different sections of the nanowire axis to be probed. In this context we consider the axial resolution of the luminescence mapping and optimization of the nanowire trapping by spherical aberration correction.

    Original languageEnglish
    Title of host publicationOptical Trapping and Optical Micromanipulation IX
    DOIs
    Publication statusPublished - 2012
    EventOptical Trapping and Optical Micromanipulation IX - San Diego, CA, United States
    Duration: 12 Aug 201216 Aug 2012

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    Volume8458
    ISSN (Print)0277-786X

    Conference

    ConferenceOptical Trapping and Optical Micromanipulation IX
    Country/TerritoryUnited States
    CitySan Diego, CA
    Period12/08/1216/08/12

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