Measurement of latent tracks in amorphous SiO2 using small angle X-ray scattering

P. Kluth*, C. S. Schnohr, D. J. Sprouster, A. P. Byrne, D. J. Cookson, M. C. Ridgway

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    42 Citations (Scopus)

    Abstract

    In this paper we present preliminary yet promising results on the measurement of latent ion tracks in amorphous, 2 μm thick SiO2 layers using small angle X-ray scattering (SAXS). The tracks were generated by ion irradiation with 89 MeV Au ions to fluences between 3 × 1010 and 3 × 1012 ions/cm2. Transmission SAXS measurements show distinct scattering from the irradiated SiO2 as compared to the unirradiated material. Analysis of the SAXS spectra using a cylindrical model suggests a core-shell like density distribution in the ion tracks with a lower density core and a higher density shell as compared to unirradiated material. The total track radius of ∼48 Å is in very good agreement with previous experiments and calculations based on an inelastic thermal spike model.

    Original languageEnglish
    Pages (from-to)2994-2997
    Number of pages4
    JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
    Volume266
    Issue number12-13
    DOIs
    Publication statusPublished - Jun 2008

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