Measurement of the bending of thin inclined nanowires as a method for determining elastic modulus

M. S. Dunaevskiy, P. A. Alekseev, P. Geydt, E. Lahderanta, T. Haggren, H. Lipsanen

Research output: Contribution to journalConference articlepeer-review

Abstract

The method of measuring nanowires elastic modulus by scanning probe microscopy is presented. This method uses the measurement of nanowire bending profiles in the precise force control mode. The possibilities of the method are demonstrated by measuring the Young's modulus of thin tapered InP nanowires.

Original languageEnglish
Article number012006
JournalIOP Conference Series: Materials Science and Engineering
Volume443
Issue number1
DOIs
Publication statusPublished - 14 Nov 2018
Externally publishedYes
EventInternational Conference on Scanning Probe Microscopy, SPM 2018 - Ekaterinburg, Russian Federation
Duration: 26 Aug 201829 Aug 2018

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