Abstract
The method of measuring nanowires elastic modulus by scanning probe microscopy is presented. This method uses the measurement of nanowire bending profiles in the precise force control mode. The possibilities of the method are demonstrated by measuring the Young's modulus of thin tapered InP nanowires.
Original language | English |
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Article number | 012006 |
Journal | IOP Conference Series: Materials Science and Engineering |
Volume | 443 |
Issue number | 1 |
DOIs | |
Publication status | Published - 14 Nov 2018 |
Externally published | Yes |
Event | International Conference on Scanning Probe Microscopy, SPM 2018 - Ekaterinburg, Russian Federation Duration: 26 Aug 2018 → 29 Aug 2018 |