Measurement of the electronic structure of crystalline silicon by electron momentum spectroscopy

M. Vos; C. Bowles; A. S. Kheifets; V. A. Sashin; E. Weigold; F. Aryasetiawan

doi:10.1016/j.elspec.2004.02.051

Measurement of the electronic structure of crystalline silicon by electron momentum spectroscopy

M. Vos^*, C. Bowles, A. S. Kheifets, V. A. Sashin, E. Weigold, F. Aryasetiawan

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

Electron momentum spectroscopy (EMS) is a scattering experiment that determines the spectral function of a sample, i.e. the density of electrons as a function of binding energy and momentum. Here, it is used to study the spectral function of silicon single crystals in the extended zone scheme. Two symmetry directions and four intermediate directions are measured. The relation between the band index and the main observed momentum component is discussed. The observed peak shapes are compared with many-body calculations based on the cumulant expansion scheme. The dispersion is described well, but peak shapes agree with many-body theory only on a semi-quantitative level.

Original language	English
Pages (from-to)	629-632
Number of pages	4
Journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	137-140
Issue number	SPEC. ISS.
DOIs	https://doi.org/10.1016/j.elspec.2004.02.051
Publication status	Published - Jul 2004

Access to Document

10.1016/j.elspec.2004.02.051

Cite this

@article{6e913318aa3f4ec7b84beba888f06c84,

title = "Measurement of the electronic structure of crystalline silicon by electron momentum spectroscopy",

abstract = "Electron momentum spectroscopy (EMS) is a scattering experiment that determines the spectral function of a sample, i.e. the density of electrons as a function of binding energy and momentum. Here, it is used to study the spectral function of silicon single crystals in the extended zone scheme. Two symmetry directions and four intermediate directions are measured. The relation between the band index and the main observed momentum component is discussed. The observed peak shapes are compared with many-body calculations based on the cumulant expansion scheme. The dispersion is described well, but peak shapes agree with many-body theory only on a semi-quantitative level.",

keywords = "Band index, Electron correlation, Electron momentum spectroscopy, Many body theory, Silicon, Spectral function",

author = "M. Vos and C. Bowles and Kheifets, {A. S.} and Sashin, {V. A.} and E. Weigold and F. Aryasetiawan",

year = "2004",

month = jul,

doi = "10.1016/j.elspec.2004.02.051",

language = "English",

volume = "137-140",

pages = "629--632",

journal = "Journal of Electron Spectroscopy and Related Phenomena",

issn = "0368-2048",

publisher = "Elsevier B.V.",

number = "SPEC. ISS.",

}

TY - JOUR

T1 - Measurement of the electronic structure of crystalline silicon by electron momentum spectroscopy

AU - Vos, M.

AU - Bowles, C.

AU - Kheifets, A. S.

AU - Sashin, V. A.

AU - Weigold, E.

AU - Aryasetiawan, F.

PY - 2004/7

Y1 - 2004/7

N2 - Electron momentum spectroscopy (EMS) is a scattering experiment that determines the spectral function of a sample, i.e. the density of electrons as a function of binding energy and momentum. Here, it is used to study the spectral function of silicon single crystals in the extended zone scheme. Two symmetry directions and four intermediate directions are measured. The relation between the band index and the main observed momentum component is discussed. The observed peak shapes are compared with many-body calculations based on the cumulant expansion scheme. The dispersion is described well, but peak shapes agree with many-body theory only on a semi-quantitative level.

AB - Electron momentum spectroscopy (EMS) is a scattering experiment that determines the spectral function of a sample, i.e. the density of electrons as a function of binding energy and momentum. Here, it is used to study the spectral function of silicon single crystals in the extended zone scheme. Two symmetry directions and four intermediate directions are measured. The relation between the band index and the main observed momentum component is discussed. The observed peak shapes are compared with many-body calculations based on the cumulant expansion scheme. The dispersion is described well, but peak shapes agree with many-body theory only on a semi-quantitative level.

KW - Band index

KW - Electron correlation

KW - Electron momentum spectroscopy

KW - Many body theory

KW - Silicon

KW - Spectral function

UR - http://www.scopus.com/inward/record.url?scp=2942529448&partnerID=8YFLogxK

U2 - 10.1016/j.elspec.2004.02.051

DO - 10.1016/j.elspec.2004.02.051

M3 - Article

SN - 0368-2048

VL - 137-140

SP - 629

EP - 632

JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

IS - SPEC. ISS.

ER -

Measurement of the electronic structure of crystalline silicon by electron momentum spectroscopy

Abstract

Access to Document

Other files and links

Fingerprint

Cite this