Mechanisms of luminescence in silicon photovoltaics

Hieu T. Nguyen, Daniel MacDonald

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Citation (Scopus)


    A measured luminescence spectrum is a complex combination of numerous phenomena occurring in both silicon wafers and measurement equipment. The emitted spectrum itself is determined by the intrinsic properties of silicon, defects and impurities in the host material, experimental conditions, and surface optics. The detected spectrum is then affected by the spectral responses of the luminescence spectroscopy/imaging system. However, by systematically controlling and monitoring the parameters which can potentially affect the detected spectra, certain properties of silicon wafers and solar cells can be evaluated. This paper reviews some basic mechanisms of luminescence phenomena in silicon wafers and solar cells. This is essential for understanding the rich information embedded in the captured PL spectra, based on which various applications in silicon photovoltaics can be established.

    Original languageEnglish
    Title of host publication2021 IEEE 48th Photovoltaic Specialists Conference, PVSC 2021
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Number of pages4
    ISBN (Electronic)9781665419222
    Publication statusPublished - 20 Jun 2021
    Event48th IEEE Photovoltaic Specialists Conference, PVSC 2021 - Fort Lauderdale, United States
    Duration: 20 Jun 202125 Jun 2021

    Publication series

    NameConference Record of the IEEE Photovoltaic Specialists Conference
    ISSN (Print)0160-8371


    Conference48th IEEE Photovoltaic Specialists Conference, PVSC 2021
    Country/TerritoryUnited States
    CityFort Lauderdale


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