Melting kinetics of confined systems at the nanoscale: Superheating and supercooling

I. D. Sharp, Q. Xu, C. W. Yuan, D. O. Yi, C. Y. Liao, A. M. Glaeser, A. M. Minor, J. W. Beeman, M. C. Ridgway, P. Kluth, J. W. Ager, D. C. Chrzan, E. E. Haller

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    In situ electron diffraction measurements of silica-embedded Ge nanocrystals reveal a melting/solidification hysteresis of 470 K which is approximately symmetric about the bulk melting point. This surprising behavior, which is thought to be impossible in bulk systems, is well described by a simple, classical thermodynamic model. Surface pre-melting, which occurs for materials with free surfaces, is suppressed by the presence of the host matrix, thereby allowing both kinetic supercooling and kinetic superheating of the embedded nanocrystals.

    Original languageEnglish
    Title of host publicationPhysics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B
    Pages191-192
    Number of pages2
    DOIs
    Publication statusPublished - 2007
    Event28th International Conference on the Physics of Semiconductors, ICPS 2006 - Vienna, Austria
    Duration: 24 Jul 200628 Jul 2006

    Publication series

    NameAIP Conference Proceedings
    Volume893
    ISSN (Print)0094-243X
    ISSN (Electronic)1551-7616

    Conference

    Conference28th International Conference on the Physics of Semiconductors, ICPS 2006
    Country/TerritoryAustria
    CityVienna
    Period24/07/0628/07/06

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