Model predictive control of atomic force microscope for fast image scanning

M. S. Rana*, H. R. Pota, I. R. Petersen

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

20 Citations (Scopus)

Abstract

This article presents the design of a model predictive control (MPC) scheme for fast tracking and accurate scanning of an atomic force microscope (AFM). The design of this controller is based on an identified model of the AFM piezoelectric tube (PZT) scanner. Total development of the AFM imaging and scanning speed has been illustrated through this paper by proper design and implementation of the MPC controller. Experimental results show that the MPC can increase the scanning speed significantly in contrast with the existing PI controller.

Original languageEnglish
Article number6426103
Pages (from-to)2477-2482
Number of pages6
JournalProceedings of the IEEE Conference on Decision and Control
DOIs
Publication statusPublished - 2012
Externally publishedYes
Event51st IEEE Conference on Decision and Control, CDC 2012 - Maui, HI, United States
Duration: 10 Dec 201213 Dec 2012

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