@inproceedings{0bcc34d607ae46298ab1ae0ddf06f895,
title = "MPC in high-speed atomic force microscopy",
abstract = "Model predictive control (MPC) is a multivariable control algorithm commonly used when tracking a reference trajectory is the primary goal. It minimizes the steady-state tracking error, increases the closed-loop bandwidth, and enables the controller to track a reference signal, the major requirements for nanopositioning applications. These capabilities motivated this research on improving the positioning performance of the piezoelectric tube scanner (PTS) in an atomic force microscope (AFM) to achieve better imaging at high scanning speed. This paper surveys the effectiveness of an MPC controller for AFM imaging by considering its different features and comparing its results with those obtained from the in-built proportional integral (PI) controller.",
keywords = "Atomic force microscope (AFM), model predictive control (MPC), raster scan, spiral scan",
author = "Rana, {M. S.} and Pota, {H. R.} and Petersen, {I. R.}",
note = "Publisher Copyright: {\textcopyright} 2016 Engineers Australia.; 2016 Australian Control Conference, AuCC 2016 ; Conference date: 03-11-2016 Through 04-11-2016",
year = "2017",
month = mar,
day = "1",
doi = "10.1109/AUCC.2016.7868017",
language = "English",
series = "2016 Australian Control Conference, AuCC 2016",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "135--140",
booktitle = "2016 Australian Control Conference, AuCC 2016",
address = "United States",
}