MPC in high-speed atomic force microscopy

M. S. Rana, H. R. Pota, I. R. Petersen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)


Model predictive control (MPC) is a multivariable control algorithm commonly used when tracking a reference trajectory is the primary goal. It minimizes the steady-state tracking error, increases the closed-loop bandwidth, and enables the controller to track a reference signal, the major requirements for nanopositioning applications. These capabilities motivated this research on improving the positioning performance of the piezoelectric tube scanner (PTS) in an atomic force microscope (AFM) to achieve better imaging at high scanning speed. This paper surveys the effectiveness of an MPC controller for AFM imaging by considering its different features and comparing its results with those obtained from the in-built proportional integral (PI) controller.

Original languageEnglish
Title of host publication2016 Australian Control Conference, AuCC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages6
ISBN (Electronic)9781922107909
Publication statusPublished - 1 Mar 2017
Externally publishedYes
Event2016 Australian Control Conference, AuCC 2016 - Newcastle, Australia
Duration: 3 Nov 20164 Nov 2016

Publication series

Name2016 Australian Control Conference, AuCC 2016


Conference2016 Australian Control Conference, AuCC 2016


Dive into the research topics of 'MPC in high-speed atomic force microscopy'. Together they form a unique fingerprint.

Cite this