Nanoscale density fluctuations in swift heavy ion irradiated amorphous SiO 2

P. Kluth*, O. H. Pakarinen, F. Djurabekova, R. Giulian, M. C. Ridgway, A. P. Byrne, K. Nordlund

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    30 Citations (Scopus)


    We report on the observation of nanoscale density fluctuations in 2 m thick amorphous SiO 2 layers irradiated with 185 MeV Au ions. At high fluences, in excess of approximately 5 10 12 ionscm 2, where the surface is completely covered by ion tracks, synchrotron small angle x-ray scattering measurements reveal the existence of a steady state of density fluctuations. In agreement with molecular dynamics simulations, this steady state is consistent with an ion track annihilation process, where high-density regions generated in the periphery of new tracks fill in low-density regions located at the center of existing tracks.

    Original languageEnglish
    Article number123520
    JournalJournal of Applied Physics
    Issue number12
    Publication statusPublished - 15 Dec 2011


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