Abstract
We present an overview of our work on the application of scanning near-field optical microscopy (SNOM) to photonic crystal structures. Our results show that SNOM can be used to map the subwavelength confinement of light to a point-defect in a 2D photonic crystal microresonator. Comparison with numerical modelling shows that SNOM is able to resolve patterns in the intensity distribution that are due to the slight non-uniformity in the crystal structure. We also discuss the future possibilities for applications of different modes of SNOM to photonic crystal devices.
Original language | English |
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Pages (from-to) | 371-377 |
Number of pages | 7 |
Journal | IEICE Transactions on Electronics |
Volume | E87-C |
Issue number | 3 |
Publication status | Published - Mar 2004 |
Externally published | Yes |