Abstract
We present an overview of our work on the application of scanning near-field optical microscopy (SNOM) to photonic crystal structures. Our results show that SNOM can be used to map the subwavelength confinement of light to a point-defect in a 2D photonic crystal microresonator. Comparison with numerical modelling shows that SNOM is able to resolve patterns in the intensity distribution that are due to the slight non-uniformity in the crystal structure. We also discuss the future possibilities for applications of different modes of SNOM to photonic crystal devices.
| Original language | English |
|---|---|
| Pages (from-to) | 371-377 |
| Number of pages | 7 |
| Journal | IEICE Transactions on Electronics |
| Volume | E87-C |
| Issue number | 3 |
| Publication status | Published - Mar 2004 |
| Externally published | Yes |