Near-surface regrowth rate effects in high-dose ion-implanted (100) silicon

J. S. Williams*, R. G. Elliman

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

41 Citations (Scopus)

Abstract

High-resolution Rutherford backscattering and channeling has been employed to investigate regrowth kinetics of amorphous layers in high-dose As- and Pb-implanted (100) silicon. Our results indicate that epitaxial regrowth rates are severely retarded by high concentrations of Pb and As in the silicon lattice and that polycrystalline growth may predominate under such conditions.

Original languageEnglish
Pages (from-to)829-831
Number of pages3
JournalApplied Physics Letters
Volume37
Issue number9
DOIs
Publication statusPublished - 1980
Externally publishedYes

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