TY - GEN
T1 - Non-invasive Characterisation of Lead Iodide Nanosheets by Nonlinear Microscopy
AU - Yan, Jingshi
AU - Ou, Qingdong
AU - Vincenti, Maria Antonietta
AU - Angelis, Costantino De
AU - Bao, Qiaoliang
AU - Neshev, Dragomir N.
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/8
Y1 - 2020/8
N2 - We demonstrate a nonlinear microscopy-based non-invasive technique for characterisation of PbI2 nanosheets. By using the polarisation, wavelength and thickness dependences of the harmonic emissions we can precisely determine their thickness, strain and crystalline orientation.
AB - We demonstrate a nonlinear microscopy-based non-invasive technique for characterisation of PbI2 nanosheets. By using the polarisation, wavelength and thickness dependences of the harmonic emissions we can precisely determine their thickness, strain and crystalline orientation.
UR - http://www.scopus.com/inward/record.url?scp=85098067129&partnerID=8YFLogxK
U2 - 10.1364/CLEOPR.2020.C7G_4
DO - 10.1364/CLEOPR.2020.C7G_4
M3 - Conference contribution
T3 - 2020 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2020 - Proceedings
BT - 2020 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2020 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2020 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2020
Y2 - 3 August 2020 through 5 August 2020
ER -