Nonlinear diffraction in orientation-patterned semiconductors

Pawel Karpinski, Xin Chen, Vladlen Shvedov, Cyril Hnatovsky, Arnaud Grisard, Eric Lallier, Barry Luther-Davies, Wieslaw Krolikowski, Yan Sheng

    Research output: Contribution to journal › Article › peer-review

    11 Citations (Scopus)

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