Novel analysis technique for measuring edge density fluctuation profiles with reflectometry in the Large Helical Device
- A. J. Creely*
- , K. Ida
- , M. Yoshinuma
- , T. Tokuzawa
- , T. Tsujimura
- , T. Akiyama
- , R. Sakamoto
- , M. Emoto
- , K. Tanaka
- , C. A. Michael
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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(Scopus)